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Advances in Imaging and Electron Physics: 158

Optical Thin Films and Coatings. Advances in Heat Transfer.

[quant-ph/] Spacetime algebra and electron physics

Quantum Information and Computation for Chemistry. Mathematical Methods and Models in Composites. Advanced Structural Damage Detection. Microrheology with Optical Tweezers.

Advances in Imaging and Electron Physics: Volume 148

Computational Modelling of Concrete Structures. Electron Backscatter Diffraction in Materials Science. Computational Fluid Dynamics in Fire Engineering.

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Vibration and Structural Acoustics Analysis. Microstructural Design of Advanced Engineering Materials. Bifurcation and Degradation of Geomaterials with Engineering Applications. Imaging Spectroscopy for Scene Analysis.

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Advanced Numerical Applications and Plasticity in Geomechanics. Materials with Complex Behaviour. Quantum Computation with Topological Codes. Computer Simulations of Molecules and Condensed Matter.

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Imaging Convection and Magnetism in the Sun. Chaos, Complexity and Transport. Sedimentation Process and Design of Settling Systems. Computational Modelling and Advanced Simulations. Fundamentals of Interface and Colloid Science.

Fundamentals of Electro-Optic Systems Design. The Essential Guide to Video Processing. Vachier Interval and Fuzzy Analysis: A Unified Approach, by W. Lodwick Planar cold cathodes, by V. T Binh and V. He has published extensively, both books and scientific journal articles, and is a member of the editorial boards of Ultramicroscopy and the Journal of Microscopy.

In , he was awarded the ScD degree by the University of Cambridge. He added mathematical morphology to the topics regularly covered; Jean Serra and Gerhard Ritter are among those who have contributed. In , he joined Professor Wollnik Giessen University and Karl Brown SLAC in organising the first international conference on charged-particle optics, designed to bring together opticians from the worlds of electron optics, accelerator optics and spectrometer optics.

This was so successful that similar meetings have been held at four-year intervals from to the present day. Grey systems and grey information Y. Liu Phase diversity L. Idier Recent developments in the imaging of magnetic domains W.


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Szmaja Stochastic deconvolution over groups B. Applications of noncausal Guass Markov random processes in multidimensional image processing A. Direct detection devices for electron microscopy A. Exploring third-order chromatic aberrations of electron lenses with computer algebra Zhixiong Liu. Multivalued diffusion PDEs for image regularization, D. Spiral phase microscopy S. Geometry of prior selection H. Parish and Phillip E. On the Regularization of the Watershed Transform, by F. Vachier Interval and Fuzzy Analysis: A Unified Approach, by W.

Lodwick Planar cold cathodes, by V. T Binh and V. Publication of this th volume is an event to be celebrated and, to mark the occasion, the editor has brought together leaders of some of the main themes of past and hopefully of future volumes: Heijmans, Morphological Image Operators, Supplement 25, with no mention of the Advances; ptychography, a highly original approach to the phase problem, the latter also the subject of a much cited Supplement W.

Serra, Advances in mathematical morphology: An important feature of these Advances is that the subjects are written in such a way that they can be understood by readers from other specialities. Generalized discrete Radon transforms and applications to image processing Radlicka: Lie algebraic methods in charged particle optics Randle: Recent developments in electron backscatter diffraction. Complex-valued neural network and complex-valued BP, by T. Nitta 'Disorder', structured diffuse scattering and local crystal chemistry, by R.

Withers Nonlinear systems for image processing, by S.

Advances in Imaging and Electron Physics, Volume 158

The Foldy-Wouthuysen transformation technique in optics, by S. Hirata Blind source separation: Carbon nanotube electron sources for electron microscopes, N. Ritter, Gonzalo Urcid 5. Origin and Background of the Invention of the Electron Microscope: Gunther Rudenberg, Paul G. Charged particles in electromagnetic fields 2. Language of aberration expansions in charged particle optics 3. Transporting charged particle beams in static fields 4.

Transporting charged particles in radiofrequency fields 5. Static magnetic charged particle analyzers 6. Electrostatic energy analyzers 7. Mass analyzers with combined electrostatic and magnetic fields 8. Time-of-flight mass analyzers 9.

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Image contrast in aberration-corrected scanning confocal electron microscopy - E. Comparison of color demosaicing methods - O. New dimensions for field emission: Conductivity Imaging and Generalised Radon Transform: Sever Skapin Optical interference near surfaces and its application in sub-wavelength microscopy - W. Beam equations Exact solutions to the beam equations Anti-paraxial expansions Solution of the beam formation problem in 3D case Asymptotic theory of 3D flows Geometrized theory Examples of applications.

Ben Haj Rhouma, M. Leitgeb Analysis of optical systems, contrast depth and measurement of electric and magnetic field distribution on the object's surface in mirror electron microscopy S. Schoenhense Multivariate statistics applications in scanning transmission electron microscopy X-ray spectrum imaging Chad M. Precession Electron Diffraction A. Thompson and Steven A. Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices especially semiconductor devices , particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.


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